Product description, Technical parameters and configuration
EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester
specially developed by TOPOSUN, which best exemplifies its multiple years of XRF film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB. The instrument outlook is elegant with simple touch. Through automatic three-dimensional movement of platform along X, Y and Z-axis, dual laser positioning and security protection system, it can realize rapid focusing and accurate analysis of various simple and complex samples suchas planar,concave-convex,cornered and arc surfaces.

Application Field
ElectroplatingIndustry
Electronic Communication
Automobile Manufacturing
Magnetic Materials
New Energ y for Aerospace
Hardware and Sanitary Ware
Electrical Equipment
Precious MetalElectroplating
Universities and Research Institutes